Abstract: The destructive testing for reliability analysis at high-power microwave (HPM) in the GaAs/InGaP hetero-junction bipolar transistor (HBT) has been rarely investigated although it has a ...
Abstract: Terahertz tomography based on time-of-flight imaging is a promising technology for non-destructive testing of composite material. Vertical incidence is necessary for this terahertz technique ...
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