Abstract: The double pulse test (DPT) configuration plays a critical role in the dynamic characterization of SiC MOSFETs due to their high dv/dt and di/dt rates. This paper investigates the impact of ...
Some kind of continuity beeper has been a standard piece of gear since the dawn of electronics. Sure, you probably have an ...
Abstract: Metallized film capacitors (MFCs) are valued for their ability to withstand high-electric-fields, yet they face short-term failure risks when subjected to overvoltage-induced self-healing ...
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