Abstract: The double pulse test (DPT) configuration plays a critical role in the dynamic characterization of SiC MOSFETs due to their high dv/dt and di/dt rates. This paper investigates the impact of ...
Abstract: This study proposes a 0.57% non-linearity continuous-time (CT) capacitance-to-voltage (C/V) converter based on a charge amplifier for MEMS accelerometers. An 800 kHz modulating signal with ...
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