Abstract: The destructive testing for reliability analysis at high-power microwave (HPM) in the GaAs/InGaP hetero-junction bipolar transistor (HBT) has been rarely investigated although it has a ...
Abstract: This paper focuses on the detection of hole-like de-fects in materials using non-destructive testing methods. The proposed approach utilizes perturbances in induced eddy currents, captured ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback