Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Two-dimensional (2D) materials have emerged as a significant class of materials promising for photocatalysis, and defect ...

Abstract: We report an electrical characterization technique to determine the defect density of states (DOS) in semiconductor nanoparticles without the interference of interface, and surface states.

Abstract: The software quality is an indicator of the ability of a software system to function in accordance with the customer requirements. In maintaining an acceptable software quality level, defect ...