Abstract: As the feature size of dynamic random access memories (DRAM) continues to scale down, the shrunk storage capacitors have met essential challenges, namely, the insufficient capacitances and ...
Abstract: This article reports the time-dependent dielectric breakdown (TDDB) reliability of zirconia (ZrO2)-based MIM capacitors with sub-0.7-nm equivalent oxide thicknesses (EOT). Results indicate ...
This section provides step-by-step instructions for integrating this plugin into a production Capacitor app. HTTPS (or localhost for development) Browser with WebAuthn support (Chrome 67+, Safari 14+, ...
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