TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Backscattered Electron and X-Ray (BEX) imaging is a method for Scanning Electron Microscopy (SEM) which obtains data from both X-Ray sensors, such as silicon drift detector, and Backscattered Electron ...
Figure 1 (a) Structure of the mesoscopic objective, (b) Aberration distribution of the mesoscopic objective, (c) Wide-field imaging system built with the mesoscopic objective, (d) Laser point-scanning ...
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