Modern Electron Backscattered Electron Diffraction (EBSD) detectors can quickly (in less than an ms) index a Kikuchi pattern, which is the diffraction pattern of crystalline materials in the SEM. With ...
Orientation Imaging Microscopy (OIM) is a technique based on the automated collection and analysis of Electron Backscatter Diffraction (EBSD) patterns. It is a powerful characterization and analysis ...
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Improving EBSD of Nickel Alloys with Schottky FE-SEM
Modern Electron Backscatter Diffraction (EBSD) detectors can index Kikuchi patterns in under a millisecond, delivering rapid insights into the crystallographic structure of materials. Image Credit: ...
MapSweeper software revolutionizes EBSD analysis by overcoming traditional indexing limitations, enhancing accuracy and speed in materials characterization.
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