Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
Nanometer SOC device manufacturing requires flexible at-speed functional testing. The semiconductor industry gradually is transitioning to nanometer manufacturing processes. With this technology comes ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback